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Agilent 4156B Semiconductor Parameter Analyzer
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Item Number
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10092
The Agilent 4156B Parametric Analyzer allows both measurement and analysis of the characteristics of semiconductor devices.
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MEASUREMENT CAPABILITIES:
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The Agilent 4156B is designed for Kelvin connections and has high-resolution SMU's. It is especially suited for low resistance and low current measurements. The 4156B is capable of performing two types of measurements: sweep measurement and sampling measurement.
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Source/Monitor Units:
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Contains 4 highly accurate SMU's
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Voltage Source Units:
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Contains 2 VSU's
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Voltage Measurement Units:
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Contains 2 VMU's
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ANALYSIS FUNCTION:
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The Agilent 4156B provides a marker and two lines for analyzing the measurement results. It also provides the automatic analysis function and displays desired calculation results after the measurement is complete.
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DATA STORING:
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The Agilent 4156B allows you to store measurement setup information, measurement data, and instrument setting information on 3.5-inch diskettes using the built in floppy drive unit, or on a NFS server via LAN. You can also use internal memory for temporary data storage of up to four files on the internal memory of the unit.
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PRINTING & PLOTTING:
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The Agilent 4156B allows you to print the setup data, measurement results, and screen images on a printer or plotter connected to the 4156B via GPIB interface or parallel I/O interface. You can also use a remove printer via LAN to make hardcopies.
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REMOTE CONTROL:
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The Agilent 4156B can be controlled by an external controller via GPIB by using remote control commands. The 4156B provides the following command sets: 4156B SCPI (Standard Commands for Programmable Instruments), 4156B FLEX (Fast Language for Execution), and 4145B Syntax Command Set.

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Agilent 4156B (Semiconductor Parameter Analyzer Equipment) Agilent 4156B (Semiconductor Parameter Analyzer Equipment)

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Agilent 4156B (Semiconductor Parameter Analyzer Equipment)
Spectrum Process Equipment, Inc.
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